Sun, X. [et al.]
Protocol conformance testing using unique input/output sequences - Singapore World Scientific 1997 - xi, 252p. - Advanced series in electrical and computer engineering; v. 1 .
981-02-2832-5
Protocol conformance testing using unique input/output sequences - Singapore World Scientific 1997 - xi, 252p. - Advanced series in electrical and computer engineering; v. 1 .
981-02-2832-5