Hurst, S. L.
VLSI testing: Digital and mixed analogue/digital techniques - London IEE 1998 - xx, 532p. - IEE circuits, devices and systems series; no. 9 .
0-85296-901-5
VLSI testing: Digital and mixed analogue/digital techniques - London IEE 1998 - xx, 532p. - IEE circuits, devices and systems series; no. 9 .
0-85296-901-5