Pham, H.

Reliability modeling, analysis and optimization - New Jersey World Scientific 2006 - xviii, 487p. - Series on quality reliability and engineering statistics. vo .

978-9-812-56388-0

International Institute of Information Technology, Bangalore
26/C, Electronics City, Hosur Road,Bengaluru-560100 Contact Us
Koha & OPAC at IIITB deployed by Bhargav Sridhar & Team.

Powered by Koha