Nonvolatile semiconductor memory technology : (Record no. 41990)
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000 -LEADER | |
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fixed length control field | 04552nam a2200961 i 4500 |
001 - CONTROL NUMBER | |
control field | 5263122 |
003 - CONTROL NUMBER IDENTIFIER | |
control field | IEEE |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20191218152114.0 |
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS | |
fixed length control field | m o d |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION | |
fixed length control field | cr |n||||||||| |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 100317t20151998nyua ob 001 0 eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9780470545409 |
Qualifying information | electronic |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
Canceled/invalid ISBN | 9780780311732 |
Qualifying information | |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
Canceled/invalid ISBN | 0470545402 |
Qualifying information | electronic |
024 7# - OTHER STANDARD IDENTIFIER | |
Standard number or code | 10.1109/9780470545409 |
Source of number or code | doi |
035 ## - SYSTEM CONTROL NUMBER | |
System control number | (CaBNVSL)mat05263122 |
035 ## - SYSTEM CONTROL NUMBER | |
System control number | (IDAMS)0b000064810c3286 |
040 ## - CATALOGING SOURCE | |
Original cataloging agency | CaBNVSL |
Language of cataloging | eng |
Description conventions | rda |
Transcribing agency | CaBNVSL |
Modifying agency | CaBNVSL |
050 #4 - LIBRARY OF CONGRESS CALL NUMBER | |
Classification number | TK7895.M4 |
Item number | N634 1998eb |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 621.39/732 |
Edition number | 22 |
245 00 - TITLE STATEMENT | |
Title | Nonvolatile semiconductor memory technology : |
Remainder of title | a comprehensive guide to understanding and to using NVSM devices / |
Statement of responsibility, etc. | edited by William D. Brown, Joe E. Brewer. |
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE | |
Place of production, publication, distribution, manufacture | New York : |
Name of producer, publisher, distributor, manufacturer | IEEE Press, |
Date of production, publication, distribution, manufacture, or copyright notice | c1998. |
264 #2 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE | |
Place of production, publication, distribution, manufacture | [Piscataqay, New Jersey] : |
Name of producer, publisher, distributor, manufacturer | IEEE Xplore, |
Date of production, publication, distribution, manufacture, or copyright notice | [1997] |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 1 PDF (xxiii, 589 pages) : |
Other physical details | illustrations. |
336 ## - CONTENT TYPE | |
Content type term | text |
Source | rdacontent |
337 ## - MEDIA TYPE | |
Media type term | electronic |
Source | isbdmedia |
338 ## - CARRIER TYPE | |
Carrier type term | online resource |
Source | rdacarrier |
490 1# - SERIES STATEMENT | |
Series statement | IEEE Press series on microelectronic systems ; |
Volume/sequential designation | 6 |
504 ## - BIBLIOGRAPHY, ETC. NOTE | |
Bibliography, etc. note | Includes bibliographical references (p. 483-553) and index. |
505 0# - FORMATTED CONTENTS NOTE | |
Formatted contents note | Basics of nonvolatile semiconductor memory devices / G. Groeseneken ... [et al.] -- Floating gate planar devices / H.C. Lin and R. Ramaswami -- Floating gate nonplanar devices / H.A.R. Wegener and W. Owen -- Floating gate flash devices / M. Gill and S. Lai -- SONOS nonvolatile semiconductor memories / M.H. White and F.R. Libsch -- Reliability and NVSM reliability / Y. Hsia and V.C. Tyree -- Radiation tolerance / G. Messenger -- Procurement considerations / D. Sweetman. |
506 1# - RESTRICTIONS ON ACCESS NOTE | |
Terms governing access | Restricted to subscribers or individual electronic text purchasers. |
520 ## - SUMMARY, ETC. | |
Summary, etc. | "Complete dependence on semiconductor vendors' application notes and data sheets is now a thing of the past thanks to this all-in-one comparison text on nonvolatile semiconductor memory (NVSM) technology. Working electronics engineers can now refer to this book to access the technical data and applications-focused perspective they need to make intelligent decisions regarding the selection, specification, procurement, and application of NVSM devices. The most comprehensive book in the field, NONVOLATILE SEMICONDUCTOR MEMORY TECHNOLOGY gathers expertly-written information scattered throughout device literature in a single, well-balanced volume. This book features an in-depth overview accompanied by applications-oriented chapters on device reliability and endurance, radiation tolerance, as well as device physics and design. It is an essential reference for electronics engineers." Sponsored by: IEEE Components, Packaging, and Manufacturing Technology Society, IEEE Solid-State Circuits Council/Society. |
530 ## - ADDITIONAL PHYSICAL FORM AVAILABLE NOTE | |
Additional physical form available note | Also available in print. |
538 ## - SYSTEM DETAILS NOTE | |
System details note | Mode of access: World Wide Web |
588 ## - SOURCE OF DESCRIPTION NOTE | |
Source of description note | Description based on PDF viewed 12/21/2015. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Semiconductor storage devices. |
655 #0 - INDEX TERM--GENRE/FORM | |
Genre/form data or focus term | Electronic books. |
695 ## - | |
-- | Aerospace electronics |
695 ## - | |
-- | Arrays |
695 ## - | |
-- | Belts |
695 ## - | |
-- | Bibliographies |
695 ## - | |
-- | Biographies |
695 ## - | |
-- | Capacitors |
695 ## - | |
-- | Cosmic rays |
695 ## - | |
-- | Dielectrics |
695 ## - | |
-- | EPROM |
695 ## - | |
-- | Electric potential |
695 ## - | |
-- | Electrodes |
695 ## - | |
-- | Failure analysis |
695 ## - | |
-- | Flash memory |
695 ## - | |
-- | History |
695 ## - | |
-- | Indexes |
695 ## - | |
-- | Insulators |
695 ## - | |
-- | Integrated circuit reliability |
695 ## - | |
-- | Integrated circuits |
695 ## - | |
-- | Logic gates |
695 ## - | |
-- | Neutrons |
695 ## - | |
-- | Nonvolatile memory |
695 ## - | |
-- | Orbits |
695 ## - | |
-- | Performance evaluation |
695 ## - | |
-- | Power supplies |
695 ## - | |
-- | Procurement |
695 ## - | |
-- | Programming |
695 ## - | |
-- | Protons |
695 ## - | |
-- | Random access memory |
695 ## - | |
-- | Reliability |
695 ## - | |
-- | Reliability engineering |
695 ## - | |
-- | SONOS devices |
695 ## - | |
-- | Satellites |
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-- | Semiconductor memory |
695 ## - | |
-- | Silicon |
695 ## - | |
-- | Testing |
695 ## - | |
-- | Timing |
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-- | Transistors |
695 ## - | |
-- | Tunneling |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Brewer, Joe |
Fuller form of name | (Joe E.) |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Brown, William D., |
Dates associated with a name | 1943- |
710 2# - ADDED ENTRY--CORPORATE NAME | |
Corporate name or jurisdiction name as entry element | John Wiley & Sons, |
Relator term | publisher. |
710 2# - ADDED ENTRY--CORPORATE NAME | |
Corporate name or jurisdiction name as entry element | IEEE Xplore (Online service), |
Relator term | distributor. |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY | |
Relationship information | Print version: |
International Standard Book Number | 9780780311732 |
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE | |
Uniform title | IEEE Press series on microelectronic systems ; |
Volume/sequential designation | 6 |
856 42 - ELECTRONIC LOCATION AND ACCESS | |
Materials specified | Abstract with links to resource |
Uniform Resource Identifier | https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263122 |
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