Introduction to optics and optical imaging / (Record no. 42010)

000 -LEADER
fixed length control field 06161nam a2201357 i 4500
001 - CONTROL NUMBER
control field 5263453
003 - CONTROL NUMBER IDENTIFIER
control field IEEE
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20191218152115.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS
fixed length control field m o d
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr |n|||||||||
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 100317t20151998nyua ob 001 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780470545010
Qualifying information electronic
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 9780780334403
Qualifying information print
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 0470545011
Qualifying information electronic
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1109/9780470545010
Source of number or code doi
035 ## - SYSTEM CONTROL NUMBER
System control number (CaBNVSL)mat05263453
035 ## - SYSTEM CONTROL NUMBER
System control number (IDAMS)0b000064810c36e7
040 ## - CATALOGING SOURCE
Original cataloging agency CaBNVSL
Language of cataloging eng
Description conventions rda
Transcribing agency CaBNVSL
Modifying agency CaBNVSL
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QC395.2
Item number .S36 1998eb
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 535/.2
Edition number 22
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Scott, Craig,
Relator term author.
245 10 - TITLE STATEMENT
Title Introduction to optics and optical imaging /
Statement of responsibility, etc. Craig Scott.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture New York :
Name of producer, publisher, distributor, manufacturer IEEE Press,
Date of production, publication, distribution, manufacture, or copyright notice c1998.
264 #2 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture [Piscataqay, New Jersey] :
Name of producer, publisher, distributor, manufacturer IEEE Xplore,
Date of production, publication, distribution, manufacture, or copyright notice [1997]
300 ## - PHYSICAL DESCRIPTION
Extent 1 PDF (xiv, 386 pages) :
Other physical details illustrations.
336 ## - CONTENT TYPE
Content type term text
Source rdacontent
337 ## - MEDIA TYPE
Media type term electronic
Source isbdmedia
338 ## - CARRIER TYPE
Carrier type term online resource
Source rdacarrier
500 ## - GENERAL NOTE
General note "IEEE order number: PC4309"--T.p. verso.
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes bibliographical references and index.
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Preface. ELECTROMAGNETICS FOR OPTICS: THREE VIEWPOINTS. Foundations of the Diffraction Integral Method. Foundations of the Plane Wave Spectrum Method. Foundations of Geometrical Optics. LENS ACTION FROM THREE VIEWPOINTS. Focusing and Imaging Properties of Lenses: Ray Optical Viewpoint. Focusing and Imaging Properties of Lenses: Diffraction Integral Viewpoint. Focusing and Imaging Properties of Lenses: The Plane WaveSpectrum Viewpoint. REFLECTIVE AND REFRACTIVE OPTICS. Classical Optical Imaging Instruments. Other Common Optical Components. Aberration Theory. OPTICAL INTERFERENCE PHENOMENA. Applications of the Plane Wave Spectrum Concept: Introduction to Diffraction Gratings. Introduction to Optical Moire Techniques. Interference and Interferometers. Introduction to Holography. INTRODUCTION TO OPTICAL INFORMATION PROCESSING. A Sampling of Optical Information Processing Systems Based on Fourier Plane Filtering. APPENDIXES. Appendix A: Elements of Vector Analysis. Appendix B: Theorems and Relations from Fourier Analysis. Appendix C: Vector Calculations in Source and Field Coordinates. Singularity Functions. Fresnel Integrals. Bessel Functions of Integer Order. Index. About the Author.
506 1# - RESTRICTIONS ON ACCESS NOTE
Terms governing access Restricted to subscribers or individual electronic text purchasers.
520 ## - SUMMARY, ETC.
Summary, etc. "With a focus on providing a working knowledge of optical systems and their principles of operation, this book employs today's most important methods for optical analysis: geometrical ray optics, raction integral techniques, and the Abbe plane wave spectrum technique. This thoughtfully organized text uses fundamental electromagnetics as its underlying framework, allowing for a comprehensive understanding of both classical and modern optics theory. Understanding the theories presented in this book is an essential step for readers who want to produce effective design using current software. The author has carefully incorporated practical mathematics throughoutfor readers who want to further their analytical understanding of the material. INTRODUCTION TO OPTICS AND OPTICAL IMAGING will be an indispensable guide for advanced undergraduate engineering students, practicing engineers, and optical scientists seeking a comprehensive background in physical optics.".
530 ## - ADDITIONAL PHYSICAL FORM AVAILABLE NOTE
Additional physical form available note Also available in print.
538 ## - SYSTEM DETAILS NOTE
System details note Mode of access: World Wide Web
588 ## - SOURCE OF DESCRIPTION NOTE
Source of description note Description based on PDF viewed 12/21/2015.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Physical optics.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Imaging systems.
655 #0 - INDEX TERM--GENRE/FORM
Genre/form data or focus term Electronic books.
695 ## -
-- Adaptive optics
695 ## -
-- Algebra
695 ## -
-- Apertures
695 ## -
-- Approximation methods
695 ## -
-- Argon
695 ## -
-- Artificial intelligence
695 ## -
-- Artificial neural networks
695 ## -
-- Biographies
695 ## -
-- Calculus
695 ## -
-- Circuit analysis
695 ## -
-- Dielectrics
695 ## -
-- Differential equations
695 ## -
-- Diffraction
695 ## -
-- Diffraction gratings
695 ## -
-- Eigenvalues and eigenfunctions
695 ## -
-- Electric fields
695 ## -
-- Electromagnetic fields
695 ## -
-- Electromagnetics
695 ## -
-- Equations
695 ## -
-- Face
695 ## -
-- Fiber optics
695 ## -
-- Field-flow fractionation
695 ## -
-- Focusing
695 ## -
-- Fourier series
695 ## -
-- Fourier transforms
695 ## -
-- Fresnel reflection
695 ## -
-- Geometrical optics
695 ## -
-- Gratings
695 ## -
-- Holographic optical components
695 ## -
-- Holography
695 ## -
-- Humans
695 ## -
-- Image reconstruction
695 ## -
-- Imaging
695 ## -
-- Indexes
695 ## -
-- Information processing
695 ## -
-- Instruments
695 ## -
-- Integral equations
695 ## -
-- Interference
695 ## -
-- Interferometers
695 ## -
-- Laser beams
695 ## -
-- Lenses
695 ## -
-- Lighting
695 ## -
-- Magnetic fields
695 ## -
-- Mathematical model
695 ## -
-- Nickel
695 ## -
-- Nonhomogeneous media
695 ## -
-- Optical computing
695 ## -
-- Optical diffraction
695 ## -
-- Optical distortion
695 ## -
-- Optical films
695 ## -
-- Optical filters
695 ## -
-- Optical imaging
695 ## -
-- Optical interferometry
695 ## -
-- Optical polarization
695 ## -
-- Optical reflection
695 ## -
-- Optical refraction
695 ## -
-- Optical resonators
695 ## -
-- Optical signal processing
695 ## -
-- Optical surface waves
695 ## -
-- Optics
695 ## -
-- Physical optics
695 ## -
-- Propagation
695 ## -
-- Regions
695 ## -
-- Retina
695 ## -
-- Sections
695 ## -
-- Shape
695 ## -
-- Spectral analysis
695 ## -
-- Spirals
695 ## -
-- Surface waves
695 ## -
-- Telescopes
695 ## -
-- Trajectory
695 ## -
-- Video recording
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element John Wiley & Sons,
Relator term publisher.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element IEEE Xplore (Online service),
Relator term distributor.
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Print version:
International Standard Book Number 9780780334403
856 42 - ELECTRONIC LOCATION AND ACCESS
Materials specified Abstract with links to resource
Uniform Resource Identifier https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263453

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