Advanced semiconductor memories : (Record no. 42099)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 05003nam a2200817 i 4500 |
| 001 - CONTROL NUMBER | |
| control field | 5265562 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | IEEE |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20191218152117.0 |
| 006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS | |
| fixed length control field | m o d |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION | |
| fixed length control field | cr |n||||||||| |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 100317t20152003njua ob 001 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9780470544136 |
| Qualifying information | electronic |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| Canceled/invalid ISBN | 9780471208136 |
| Qualifying information | |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| Canceled/invalid ISBN | 0470544139 |
| Qualifying information | electronic |
| 024 7# - OTHER STANDARD IDENTIFIER | |
| Standard number or code | 10.1109/9780470544136 |
| Source of number or code | doi |
| 035 ## - SYSTEM CONTROL NUMBER | |
| System control number | (CaBNVSL)mat05265562 |
| 035 ## - SYSTEM CONTROL NUMBER | |
| System control number | (IDAMS)0b000064810c5655 |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | CaBNVSL |
| Language of cataloging | eng |
| Description conventions | rda |
| Transcribing agency | CaBNVSL |
| Modifying agency | CaBNVSL |
| 050 #4 - LIBRARY OF CONGRESS CALL NUMBER | |
| Classification number | TK7895.M4 |
| Item number | .S4897 2003eb |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.39/732 |
| Edition number | 22 |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Sharma, Ashok K., |
| Relator term | author. |
| 245 10 - TITLE STATEMENT | |
| Title | Advanced semiconductor memories : |
| Remainder of title | architectures, designs, and applications / |
| Statement of responsibility, etc. | Ashok K. Sharma. |
| 264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE | |
| Place of production, publication, distribution, manufacture | Piscataway, New Jersey : |
| Name of producer, publisher, distributor, manufacturer | IEEE Press, |
| Date of production, publication, distribution, manufacture, or copyright notice | c2003. |
| 264 #2 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE | |
| Place of production, publication, distribution, manufacture | [Piscataqay, New Jersey] : |
| Name of producer, publisher, distributor, manufacturer | IEEE Xplore, |
| Date of production, publication, distribution, manufacture, or copyright notice | [2002] |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 1 PDF (xvii, 652 pages) : |
| Other physical details | illustrations. |
| 336 ## - CONTENT TYPE | |
| Content type term | text |
| Source | rdacontent |
| 337 ## - MEDIA TYPE | |
| Media type term | electronic |
| Source | isbdmedia |
| 338 ## - CARRIER TYPE | |
| Carrier type term | online resource |
| Source | rdacarrier |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE | |
| Bibliography, etc. note | Includes bibliographical references and index. |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Formatted contents note | Preface. Introduction to Advanced Semiconductor Memories. Static Random Access Memory Technologies. High-Performance Dynamic random Access Memories. Application-Specific Dram Architectures and Designs. Advanced Nonvolatile Memory Designs and Technologies. Embedded Memories Designs and Applications. Future Memory Directions: Megabytes to Terabytes. Index. |
| 506 1# - RESTRICTIONS ON ACCESS NOTE | |
| Terms governing access | Restricted to subscribers or individual electronic text purchasers. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc. | A valuable reference for the most vital microelectronic components in the marketplace DRAMs are the technology drivers of high volume semiconductor fabrication processes for new generation products that, in addition to computer markets, are finding increased usage in automotive, aviation, military and space, telecommunications, and wireless industries. A new generation of high-density and high-performance memory architectures evolving for mass storage devices, including embedded memories and nonvolatile flash memories, are serving a diverse range of applications. Comprehensive and up to date, Advanced Semiconductor Memories: Architectures, Designs, and Applications offers professionals in the semiconductor and related industries an in-depth review of advanced semiconductor memories technology developments. It provides details on: . Static Random Access Memory technologies including advanced architectures, low voltage SRAMs, fast SRAMs, SOI SRAMs, and specialty SRAMs (multiport, FIFOs, CAMs). High Performance Dynamic Random Access Memory-DDRs, synchronous DRAM/SGRAM features and architectures, EDRAM, CDRAM, Gigabit DRAM scaling issues and architectures, multilevel storage DRAMs, and SOI DRAMs. Applications-specific DRAM architectures and designs - VRAMs, DDR SGRAMs, RDRAMs, SLDRAMs, 3-D RAM. Advanced Nonvolatile Memory designs and technologies, including floating gate cell theory, EEPROM/flash memory cell design, and multilevel flash. FRAMs and reliability issues. Embedded memory designs and applications, including cache, merged processor, DRAM architectures, memory cards, and multimedia applications. Future memory directions with megabytes to terabytes storage capacities using RTDs, single electron memories, etc. A continuation of the topics introduced in Semiconductor Memories: Technology, Testing, and Reliability, the author's earlier work, Advanced Semiconductor Memories: Architectures, Designs, and Applications offers a much-needed reference to the major developments and future directions of advanced semiconductor memory technology. |
| 530 ## - ADDITIONAL PHYSICAL FORM AVAILABLE NOTE | |
| Additional physical form available note | Also available in print. |
| 538 ## - SYSTEM DETAILS NOTE | |
| System details note | Mode of access: World Wide Web |
| 588 ## - SOURCE OF DESCRIPTION NOTE | |
| Source of description note | Description based on PDF viewed 12/21/2015. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Semiconductor storage devices. |
| 655 #0 - INDEX TERM--GENRE/FORM | |
| Genre/form data or focus term | Electronic books. |
| 695 ## - | |
| -- | Arrays |
| 695 ## - | |
| -- | Built-in self-test |
| 695 ## - | |
| -- | Capacitance |
| 695 ## - | |
| -- | Capacitors |
| 695 ## - | |
| -- | Circuit faults |
| 695 ## - | |
| -- | Clocks |
| 695 ## - | |
| -- | Computer architecture |
| 695 ## - | |
| -- | EPROM |
| 695 ## - | |
| -- | Ferroelectric films |
| 695 ## - | |
| -- | Flash memory |
| 695 ## - | |
| -- | Graphics |
| 695 ## - | |
| -- | Indexes |
| 695 ## - | |
| -- | Logic gates |
| 695 ## - | |
| -- | MOS devices |
| 695 ## - | |
| -- | Magnetization |
| 695 ## - | |
| -- | Memory management |
| 695 ## - | |
| -- | Microprocessors |
| 695 ## - | |
| -- | Noise |
| 695 ## - | |
| -- | Nonvolatile memory |
| 695 ## - | |
| -- | Performance evaluation |
| 695 ## - | |
| -- | Pins |
| 695 ## - | |
| -- | RNA |
| 695 ## - | |
| -- | Random access memory |
| 695 ## - | |
| -- | Read only memory |
| 695 ## - | |
| -- | Resistance |
| 695 ## - | |
| -- | SDRAM |
| 695 ## - | |
| -- | Semiconductor memory |
| 695 ## - | |
| -- | Synchronization |
| 695 ## - | |
| -- | System-on-a-chip |
| 710 2# - ADDED ENTRY--CORPORATE NAME | |
| Corporate name or jurisdiction name as entry element | John Wiley & Sons, |
| Relator term | publisher. |
| 710 2# - ADDED ENTRY--CORPORATE NAME | |
| Corporate name or jurisdiction name as entry element | IEEE Xplore (Online service), |
| Relator term | distributor. |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY | |
| Relationship information | Print version: |
| International Standard Book Number | 9780471208136 |
| 856 42 - ELECTRONIC LOCATION AND ACCESS | |
| Materials specified | Abstract with links to resource |
| Uniform Resource Identifier | https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265562 |
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