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Reliability wearout mechanisms in advanced CMOS technologies / (Record no. 42200)

000 -LEADER
fixed length control field	03294nam a2200877 i 4500
001 - CONTROL NUMBER
control field	5361029
003 - CONTROL NUMBER IDENTIFIER
control field	IEEE
005 - DATE AND TIME OF LATEST TRANSACTION
control field	20191218152119.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS
fixed length control field	m o d
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field	cr \|n\|\|\|\|\|\|\|\|\|
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field	110519t20152009njua ob 001 0 eng d
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
Canceled/invalid LC control number	2011377262 (print)
015 ## - NATIONAL BIBLIOGRAPHY NUMBER
Canceled/invalid national bibliography number	GBA944641 (print)
015 ## - NATIONAL BIBLIOGRAPHY NUMBER
Canceled/invalid national bibliography number	015-17502 (print)
016 ## - NATIONAL BIBLIOGRAPHIC AGENCY CONTROL NUMBER
Canceled/invalid control number	015175021 (print)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number	9780470455265
Qualifying information	electronic
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN	9780471731726
Qualifying information	paper
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN	0471731722
Qualifying information	paper
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN	0470455268
Qualifying information	electronic
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code	10.1002/9780470455265
Source of number or code	doi
035 ## - SYSTEM CONTROL NUMBER
System control number	(CaBNVSL)mat05361029
035 ## - SYSTEM CONTROL NUMBER
System control number	(IDAMS)0b00006481178849
040 ## - CATALOGING SOURCE
Original cataloging agency	CaBNVSL
Language of cataloging	eng
Description conventions	rda
Transcribing agency	CaBNVSL
Modifying agency	CaBNVSL
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number	TK7871.99.M44
Item number	R455 2009eb
084 ## - OTHER CLASSIFICATION NUMBER
Classification number	ELT 358f
Number source	stub
084 ## - OTHER CLASSIFICATION NUMBER
Classification number	ZN 4960
Number source	rvk
245 00 - TITLE STATEMENT
Title	Reliability wearout mechanisms in advanced CMOS technologies /
Statement of responsibility, etc.	Alvin W. Strong ... [et al.].
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture	Piscataway, New Jersey :
Name of producer, publisher, distributor, manufacturer	IEEE Press,
Date of production, publication, distribution, manufacture, or copyright notice	c2009.
300 ## - PHYSICAL DESCRIPTION
Extent	1 PDF (xv, 624 pages) :
Other physical details	illustrations.
336 ## - CONTENT TYPE
Content type term	text
Source	rdacontent
337 ## - MEDIA TYPE
Media type term	electronic
Source	isbdmedia
338 ## - CARRIER TYPE
Carrier type term	online resource
Source	rdacarrier
490 1# - SERIES STATEMENT
Series statement	IEEE Press series on microelectronic systems ;
Volume/sequential designation	12
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note	Includes bibliographical references and index.
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note	Introduction / Alvin W. Strong -- Dielectric characterization and reliability methodology / Ernest Y. Wu, Rolf-Peter Vollertsen, and Jordi Su�n�e -- Dielectric breakdown of gate oxides: physics and experiments / Ernest Y. Wu, Rolf-Peter Vollertsen, and Jordi Su�n�e -- Negative bias temperature instabilities in pMOSFET devices / Giuseppe LaRosa -- Hot carriers / Stewart E. Rauch, III -- Stress-induced voiding / Timothy D. Sullivan -- Electromigration / Timothy D. Sullivan.
506 1# - RESTRICTIONS ON ACCESS NOTE
Terms governing access	Restricted to subscribers or individual electronic text purchasers.
538 ## - SYSTEM DETAILS NOTE
System details note	Mode of access: World Wide Web.
588 ## - SOURCE OF DESCRIPTION NOTE
Source of description note	Description based on PDF viewed 12/18/2015.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element	Metal oxide semiconductors, Complementary
General subdivision	Reliability.
655 #0 - INDEX TERM--GENRE/FORM
Genre/form data or focus term	Electronic books.
695 ## -
--	Acceleration
695 ## -
--	Atomic measurements
695 ## -
--	Books
695 ## -
--	CMOS integrated circuits
695 ## -
--	CMOS technology
695 ## -
--	Charge carrier processes
695 ## -
--	Degradation
695 ## -
--	Dielectrics
695 ## -
--	Electric breakdown
695 ## -
--	Electromigration
695 ## -
--	Electron traps
695 ## -
--	Force
695 ## -
--	Hot carriers
695 ## -
--	Indexes
695 ## -
--	Interface states
695 ## -
--	Junctions
695 ## -
--	Logic gates
695 ## -
--	MOSFET circuits
695 ## -
--	Materials
695 ## -
--	Metallization
695 ## -
--	Nitrogen
695 ## -
--	Reliability
695 ## -
--	Reliability engineering
695 ## -
--	Silicon
695 ## -
--	Strain
695 ## -
--	Stress
695 ## -
--	Substrates
695 ## -
--	Transistors
695 ## -
--	Wires
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name	Strong, Alvin Wayne,
Dates associated with a name	1946-
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element	IEEE Xplore (Online Service),
Relator term	distributor.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element	Wiley,
Relator term	publisher.
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information	Print version:
Record control number	2011377262
International Standard Book Number	9780471731726
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title	IEEE Press Series on Microelectronic Systems ;
Volume/sequential designation	12
856 42 - ELECTRONIC LOCATION AND ACCESS
Materials specified	Abstract with links to resource
Uniform Resource Identifier	https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029

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Reliability wearout mechanisms in advanced CMOS technologies / (Record no. 42200)