Fundamentals of infrared and visible detector operation and testing / (Record no. 42926)

000 -LEADER
fixed length control field 05596nam a2200529 i 4500
001 - CONTROL NUMBER
control field 8040174
003 - CONTROL NUMBER IDENTIFIER
control field IEEE
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20191218152131.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS
fixed length control field m o d
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr |n|||||||||
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 171024s2008 mau ob 001 eng d
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
Canceled/invalid LC control number 2015000695 (print)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781119011897
Qualifying information electronic
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 9781118094884
Qualifying information cloth
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.1002/9781119011897
Source of number or code doi
035 ## - SYSTEM CONTROL NUMBER
System control number (CaBNVSL)mat08040174
035 ## - SYSTEM CONTROL NUMBER
System control number (IDAMS)0b00006485f0e688
040 ## - CATALOGING SOURCE
Original cataloging agency CaBNVSL
Language of cataloging eng
Description conventions rda
Transcribing agency CaBNVSL
Modifying agency CaBNVSL
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TA1570
Item number .V56 2016eb
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.36/2
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Vincent, John David,
Relator term author.
240 10 - UNIFORM TITLE
Uniform title Fundamentals of infrared detector operation and testing
245 10 - TITLE STATEMENT
Title Fundamentals of infrared and visible detector operation and testing /
Statement of responsibility, etc. .John David Vincent, Steven E. Hodges, John Vampola, Mark Stegall, Greg Pierce.
250 ## - EDITION STATEMENT
Edition statement Second edition.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture Hoboken, New Jersey :
Name of producer, publisher, distributor, manufacturer Wiley,
Date of production, publication, distribution, manufacture, or copyright notice [2016]
264 #2 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture [Piscataqay, New Jersey] :
Name of producer, publisher, distributor, manufacturer IEEE Xplore,
Date of production, publication, distribution, manufacture, or copyright notice [2015]
300 ## - PHYSICAL DESCRIPTION
Extent 1 PDF (xv, 564 pages).
336 ## - CONTENT TYPE
Content type term text
Source rdacontent
337 ## - MEDIA TYPE
Media type term electronic
Source isbdmedia
338 ## - CARRIER TYPE
Carrier type term online resource
Source rdacarrier
490 1# - SERIES STATEMENT
Series statement Wiley series in pure and applied optics
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes bibliographical references and index.
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Foreword ix -- Preface xiii -- About the Companion Website xv -- UNIT I DETECTOR BASICS 1 -- 1 Introduction and Overview 3 -- 2 Radiometry 25 -- 3 Thermal Detectors: Mechanisms, Operation, and Performance 85 -- 4 Classical Photon Detectors: Simple Photoconductor and Photovoltaics 105 -- 5 Modern Photon Detectors 149 -- UNIT II DETECTOR ASSEMBLIES 171 -- 6 Single Detector Assemblies and Small Arrays 173 -- 7 Readout Integrated Circuits 191 -- 8 Electronics for FPA Operation 237 -- UNIT III TESTING 257 -- 9 Test Equipment 259 -- 10 Detector Testing 315 -- UNIT IV RELATED SKILLS 379 -- 11 Measurements and Uncertainty 381 -- 12 Cryogenics 407 -- 13 Vacuum 441 -- 14 Optics and Optical Materials 469 -- 15 Fourier Analysis of Detector Problems 507 -- Appendix A / Symbols, Abbreviations, and Acronyms 549 -- Index 553
506 ## - RESTRICTIONS ON ACCESS NOTE
Terms governing access Restricted to subscribers or individual electronic text purchasers.
520 ## - SUMMARY, ETC.
Summary, etc. This book presents a comprehensive introduction to the selection, operation, and testing of infrared devices, including a description of modern detector assemblies and their operation This book discusses how to use and test infrared and visible detectors. The book provides a convenient reference for those entering the field of IR detector design, test or use, those who work in the peripheral areas, and those who teach and train others in the field. Chapter 1 contains introductory material. Radiometry is covered in Chapter 2. The author examines Thermal detectors in Chapter 3; the (3z(BClassical(3y(B photon detectors / simple photoconductors and photovoltaics in Chapter 4; and (3z(BModern Photon Detectors(3y(B in Chapter 5. Chapters 6 through 8 consider respectively individual elements and small arrays of elements the (3z(Breadouts(3y(B (ROICs) used with large imaging arrays; and Electronics for FPA Operation and Testing. The Test Set and The Testing Process are analyzed in Chapters 9 and 10, with emphasis on uncertainty and trouble shooting. Chapters 11 through 15 discuss related skills, such as Uncertainty, Cryogenics, Vacuum, Optics, and the use of Fourier Transforms in the detector business. Some highlights of this new edition are that it * Discusses radiometric nomenclature and calculations, detector mechanisms, the associated electronics, how these devices are tested, and real-life effects and problems * Examines new tools in Infrared detector operations, specifically: selection and use of ROICs, electronics for FPA operation, operation of single element and very small FPAs, microbolometers, and multi-color FPAs * Contains five chapters with frequently sought-after information on related subjects, such as uncertainty, optics, cryogenics, vacuum, and the use of Fourier mathematics for detector analyses Fundamentals of Infrared and Visible Detector Operation and Testing, Second Edition, provides the background and vocabulary necessary to help readers understand the selection, operation, and testing of modern infrared devices. John David Vincent: Consultant after 50 years as an IR test engineer and system engineer (SBRC, Amber Engineering, Raytheon Infrared Operations, FLIR-Indigo). His interests include uncertainty analysis, radiometrics, data analysis and presentation. Steve Hodges (Principal Senior Scientist, Alion Science and Technology) has developed fire detection and suppression systems for 30 years. John Vampola (Principal Engineering Fellow, Raytheon Vision Systems) has specialized in ROIC and FPA design and applications for 35 years. Mark Stegall and Greg Pierce. (Founder and CEO respectively SE-IR Corporation, Goleta, CA) have designed and produced test electronics for FPA evaluation and imaging demonstrations for over 25 years.
530 ## - ADDITIONAL PHYSICAL FORM AVAILABLE NOTE
Additional physical form available note Also available in print.
538 ## - SYSTEM DETAILS NOTE
System details note Mode of access: World Wide Web
588 ## - SOURCE OF DESCRIPTION NOTE
Source of description note Description based on PDF viewed 10/24/2017.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Infrared detectors.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Optical detectors.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Infrared detectors
General subdivision Testing.
655 #0 - INDEX TERM--GENRE/FORM
Genre/form data or focus term Electronic books.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element IEEE Xplore (Online Service),
Relator term distributor.
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element Wiley,
Relator term publisher.
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title Wiley series in pure and applied optics
856 42 - ELECTRONIC LOCATION AND ACCESS
Materials specified Abstract with links to resource
Uniform Resource Identifier https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=8040174

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