Credit risk measurement: New approaches to value at risk and other paradigms
By: Saunders, A.
Material type:
BookPublisher: New York John Wiley & Sons 2002Edition: 2nd ed.Description: xiii, 319p.ISBN: 0-471-21910-X.
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| 332.120684 SAU (Browse shelf) | Available | 502064 |
Browsing International Institute of Information Technology Bangalore Shelves Close shelf browser
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