Journey to data quality
By: Lee, Y. W. et.al.
Material type: BookPublisher: Cambridge; Massachusetts MIT Press 2006Description: xii, 226p.ISBN: 978-0-262-12287-0.Item type | Current location | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|
658.4038 LEE (Browse shelf) | Available | 506207 |
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