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Next Generation Wireless LANs: Throughput, Robustness, and Reliability in 802.11n

By: Perahia, E.
Material type: materialTypeLabelBookPublisher: Cambridge Cambridge University Press 2008Description: xxx, 385p.ISBN: 978-0-521-88584-3.
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Item type Current location Call number Status Date due Barcode
621.3848 PER (Browse shelf) Available 506490

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