Photoinduced Defects in Semiconductors
By: Redfield, D.
Material type: BookSeries: Cambridge Studies in Semiconductor Phusics and Microelectron.Publisher: Cambridge Cambridge University Press 1996Description: x, 217p.ISBN: 0-521-46196-0.Item type | Current location | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|
621.38152 RED (Browse shelf) | Available | 508306 |
There are no comments for this item.