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Markov random field modeling in image analysis. 3rd. edn.

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BookSeries: Advances in Pattern Recognition.Publisher: London Springer-Verlag 2009Description: xxiii, 357p.ISBN: 978-1-84800-278-4.

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Item type	Current location	Call number	Status	Date due	Barcode
		621.36701519233 LI (Browse shelf)	Checked out	06/30/2017	509035

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