Electronic thin-film reliability
By: Tu, K.
Material type: BookPublisher: Cambridge Cambridge University Press 2011Description: xvi, 396.ISBN: 978-0-521-51613-6.Item type | Current location | Call number | Status | Date due | Barcode |
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621.38152 TU (Browse shelf) | Available | 509858 |
Browsing International Institute of Information Technology Bangalore Shelves Close shelf browser
621.38152 STR Solid state electronic devices. 5th. Edition. | 621.38152 STR Solid state electronic devices. 6ed. | 621.38152 SUT Logical effort: Designing fast CMOS Circuits | 621.38152 TU Electronic thin-film reliability | 621.38152 TYA Introduction to semiconductor materials and devices | 621.38152 VIT Radiation defect engineering | 621.38152 YOO Semiconductor manufacturing technology |
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