System level ESD co-design / Charvaka Duvvury, Independent ESD Industry Consultant, Texas, USA, Harald Gossner, Intel, Germany.
By: Duvvury, Charvaka.
Contributor(s): Gossner, Harald | IEEE Xplore (Online Service) [distributor.] | Wiley [publisher.].
Material type:
BookSeries: Wiley - IEEE: Publisher: Hoboken : John Wiley and Sons, Inc., 2015Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2016]Description: 1 PDF (424 pages).Content type: text Media type: electronic Carrier type: online resourceISBN: 9781118861899.Subject(s): Shielding (Electricity) | Electronic apparatus and appliances -- Design and construction | Integrated circuits -- Design and construction | Integrated circuits -- Protection | Electrostatics | Static eliminators | Automotive applications | Capacitance | Couplings | Discharges (electric) | Electrostatic discharges | Failure analysis | Grounding | IEC | IEC Standards | Impedance | Industries | Integrated circuit modeling | Integrated circuits | Junctions | Law | Limiting | Logic gates | Manufacturing | Metals | Mobile communication | Mobile handsets | Performance evaluation | Pins | Probabilistic logic | Production | Production facilities | Qualifications | Robustness | Software | Standards | Stress | Testing | Transient analysis | Voltage control | Voltage measurementGenre/Form: Electronic books.DDC classification: 537/.2 Online resources: Abstract with links to resource Also available in print.Includes bibliographical references and index.
Machine generated contents note: Chapter 1 Introduction Charvaka Duvvury Chapter 2 Component Versus System Level ESD Charvaka Duvvury and Harald Gossner Chapter 3 System Level Testing for ESD Susceptibility Michael Hopkins Chapter 4 PCB/IC Co-Design Concepts for SEED Harald Gossner and Charvaka Duvvury Chapter 5 Hard Fails & PCB Protection Devices Robert Ashton Chapter 6 Soft Fail and PCB design measures David Pommerenke and Pratik Maheshwari Chapter 7 ESD in Mobile Devices Matti Uusimaki Chapter 8 ESD for Automotive Applications Wolfgang Reinprecht Chapter 9 Futire Applications of SEED Methodology Harald Gossner and Charvaka Duvvury Chapter 10 Co-Design Tradeoffs: Balancing Robustness, Performance and Cost Jeffery C -- Dunnihoo Index .
Restricted to subscribers or individual electronic text purchasers.
"Demystifies the concept of system-level ESD and details its difference from the conventional component level ESD design and testing. Describes the protection elements and designs and focuses on the "co-design", an optimization methodology to address both issues in the same design space"-- Provided by publisher.
Also available in print.
Mode of access: World Wide Web
Description based on PDF viewed 07/04/2016.
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