Terrestrial neutron induced soft errors in advanced memory devices
By: Nakamura, T. et.al.
Material type: BookPublisher: New Jersey World Scientific 2008Description: xxii, 343p.ISBN: 978-9-812-77881-9.Item type | Current location | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|
621.3973205392 NAK (Browse shelf) | Available | 508696 |
There are no comments for this item.