1.
Logic testing and design for testability / Hideo Fujiwara.
by Fujiwara, Hideo [author.] | IEEE Xplore (Online Service) [distributor.] | MIT Press [publisher.] .
Material type: ; Format:
available online
Publisher: Cambridge, Massachusetts : MIT Press, c1985Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1985]Online access: Abstract with links to resource Availability: No items available
2.
The rationality quotient : toward a test ofrational thinking / Keith E. Stanovich, Richard F. West, and Maggie E. Toplak.
by Stanovich, Keith E, 1950- [author.] | West, Richard F [author.] | Toplak, Maggie E [author.] | IEEE Xplore (Online Service) [distributor.] | MIT Press [publisher.] .
Material type: ; Format:
available online
Publisher: Cambridge, Massachusetts : The MIT Press, [2016]Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2016]Online access: Abstract with links to resource Availability: No items available
3.
Test driven development by example Kent Beck
by Beck, K.
Material type: ; Format:
print
; Literary form:
not fiction
Publisher: New Delhi Pearson 2007Availability: Items available for loan: [Call number: 005.14 BEC] (1).
4.
Pragmatic unit testing: In C# with Nunit. 2nd. Edition. Andy Hunt
by Hunt, A | Hargett, M | Thomas, D.
Material type: ; Format:
print
; Literary form:
not fiction
Publisher: Mumbai Shroff Publishers 2007Availability: Items available for loan: [Call number: 005.133 HUN] (1).
5.
Automated defect prevention : best practices in software management / Dorota Huizinga, Adam Kolawa.
by Huizinga, Dorota [author.] | Kolawa, Adam | IEEE Xplore (Online Service) [distributor.] | Wiley InterScience (Online service) [publisher.] .
Material type: ; Format:
available online
; Literary form:
not fiction
Publisher: Hoboken, New Jersey : Wiley-Interscience : c2007Online access: Abstract with links to resource Availability: No items available
6.
Software testing : testing across the entire software development life cycle / Gerald D. Everett, Raymond McLeod, Jr.
by Everett, Gerald D, 1943- [author.] | McLeod, Raymond | IEEE Xplore (Online service) [distributor.] .
Material type: ; Format:
available online
; Literary form:
not fiction
Publisher: [Piscataway, New Jersey] : IEEE Press, c2007Online access: Abstract with links to resource Availability: No items available
7.
Accelerated stress testing handbook : guide for achieving quality products / edited by H. Anthony Chan, Paul J. Englert.
by Chan, H. Anthony, 1952- | Englert, Paul J, 1960- | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.] .
Material type: ; Format:
available online
; Literary form:
not fiction
Publisher: New York : IEEE Press, c2001Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2009]Online access: Abstract with links to resource Availability: No items available
8.
Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
by Abramovici, Miron [author.] | Breuer, Melvin A | Friedman, Arthur D | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.] .
Material type: ; Format:
available online
; Literary form:
not fiction
Publisher: New York, NY : Computer Science Press, c1990Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1994]Online access: Abstract with links to resource Availability: No items available
9.
Integrated circuit manufacturability : the art of process and design integration / edited by Jos�e Pineda de Gyvez, Dhiraj Pradhan.
by Pradhan, Dhiraj K | Pineda de Gyvez, Jos�e | John Wiley & Sons [publisher.] | IEEE Circuits and Systems Society | IEEE Xplore (Online service) [distributor.] .
Material type: ; Format:
available online
; Literary form:
not fiction
Publisher: Piscataway, New Jersey : IEEE Press, c1999Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1998]Online access: Abstract with links to resource Availability: No items available
10.
Semiconductor material and device characterization / Dieter K. Schroder.
by Schroder, Dieter K [author.] | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.] .
Edition: 3rd ed.Material type: ; Format:
available online
Publisher: [Piscataway, New Jersey] : IEEE Press, c2006Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2006]Online access: Abstract with links to resource Availability: No items available
11.
Fundamentals of infrared and visible detector operation and testing / .John David Vincent, Steven E. Hodges, John Vampola, Mark Stegall, Greg Pierce.
by Vincent, John David [author.] | IEEE Xplore (Online Service) [distributor.] | Wiley [publisher.] .
Edition: Second edition.Material type: ; Format:
available online
Publisher: Hoboken, New Jersey : Wiley, [2016]Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2015]Online access: Abstract with links to resource Availability: No items available
12.
Transformer ageing : monitoring and estimation techniques / edited by Tapan Kumar Saha, Prithwiraj Purkait.
by Saha, Tapan Kumar, 1959- [editor.] | Purkait, Prithwiraj, 1973- [editor.] | IEEE Xplore (Online Service) [distributor.] | Wiley [publisher.] .
Material type: ; Format:
available online
Publisher: Chichester, West Sussex : John Wiley & Sons, Inc., 2018Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2017]Other title: Transformer aging.Online access: Abstract with links to resource Availability: No items available
13.
Current Signature Analysis for Condition Monitoring of Cage Induction Motors : Industrial Application and Case Histories / William T. Thomson, Ian Culbert.
by Thomson, William T [author.] | Culbert, Ian | IEEE Xplore (Online Service) [distributor.] | Wiley [publisher.] .
Material type: ; Format:
available online
Publisher: Hoboken, New Jersey : Wiley : IEEE Press, 2016Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2016]Online access: Abstract with links to resource Availability: No items available
14.
Verification of communication protocols in web services : model-checking service compositions / Zahir Tari, Peter Bertok, Anshuman Mukherjee, RMIT University.
by Tari, Zahir [author.] | Bert�ok, P�eter, 1952- | Mukherjee, Anshuman | IEEE Xplore (Online Service) [distributor.] | Wiley [publisher.] .
Material type: ; Format:
available online
Publisher: Hoboken, New Jersey : Wiley, [2014]Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2013]Online access: Abstract with links to resource Availability: No items available
15.
Software quality engineering : Testing, quality assurance, and quantifiable improvement / Jeff Tian.
by Tian, Jeff [author.] | IEEE Xplore (Online Service) [distributor.] | Wiley [publisher.] .
Material type: ; Format:
available online
Publisher: Hoboken, New Jersey : Wiley, c2005Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2014]Online access: Abstract with links to resource Availability: No items available
16.
Ultrasonic inspection technology development and search units design : examples of practical applications / by Mark V. Brook.
by Brook, Mark V [author.] | IEEE Xplore (Online Service) [distributor.] | John Wiley & Sons [publisher.] .
Material type: ; Format:
available online
Publisher: [Hoboken, New Jersey] : Wiley, c2012Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2012]Online access: Abstract with links to resource Availability: No items available
17.
Software quality engineering : testing, quality assurance, and quantifiable improvement / Jeff Tian.
by Tian, Jeff [author.] | IEEE Xplore (Online Service) [distributor.] | John Wiley & Sons [publisher.] .
Material type: ; Format:
available online
Publisher: Hoboken, New Jersey : Wiley, c2005Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2005]Online access: Abstract with links to resource Availability: No items available
18.
RF measurements for cellular phones and wireless data systems / Allan W. Scott, Rex Frobenius.
by Scott, Allan W [author.] | Frobenius, Rex | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.] .
Material type: ; Format:
available online
; Literary form:
not fiction
Publisher: Hoboken, New Jersey : IEEE, c2008Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2008]Online access: Abstract with links to resource Availability: No items available
19.
Dynamic vulnerability assessment and intelligent control for sustainable power systems / edited by Professor Jose L. Rueda Torres, Professor Francisco Gonzalez-Longatt.
by Rueda Torres, Jos�e L, 1980- [editor.] | Gonzalez-Longatt, Francisco, 1972- [editor.] | IEEE Xplore (Online Service) [distributor.] | Wiley [publisher.] .
Edition: First edition.Material type: ; Format:
available online
Publisher: Hoboken, New Jersey : Wiley, 2018Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2018]Online access: Abstract with links to resource Availability: No items available
20.
An introduction to TTCN-3 / Colin Willcock ... [et al.].
by Willcock, Colin | IEEE Xplore (Online Service) [distributor.] | Wiley [publisher.] .
Edition: 2nd ed.Material type: ; Format:
available online
Publisher: Chichester ; Wiley, 2011Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2011]Online access: Abstract with links to resource Availability: No items available
