000 00405nam a2200121Ia 4500
008 160523s9999 xx 000 0 und d
020 _a981-02-2832-5
100 _aSun, X. [et al.]
245 _aProtocol conformance testing using unique input/output sequences
260 _aSingapore
_bWorld Scientific
_c1997
300 _axi, 252p.
490 _aAdvanced series in electrical and computer engineering; v. 1
999 _c27214
_d27214