| 000 | 00340nam a2200109Ia 4500 | ||
|---|---|---|---|
| 008 | 160523s9999 xx 000 0 und d | ||
| 020 | _a978-9-812-77881-9 | ||
| 100 | _aNakamura, T. et.al. | ||
| 245 | _aTerrestrial neutron induced soft errors in advanced memory devices | ||
| 260 |
_aNew Jersey _bWorld Scientific _c2008 |
||
| 300 | _axxii, 343p. | ||
| 999 |
_c33006 _d33006 |
||