000 | 05003nam a2200817 i 4500 | ||
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001 | 5265562 | ||
003 | IEEE | ||
005 | 20191218152117.0 | ||
006 | m o d | ||
007 | cr |n||||||||| | ||
008 | 100317t20152003njua ob 001 0 eng d | ||
020 |
_a9780470544136 _qelectronic |
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020 |
_z9780471208136 _qprint |
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020 |
_z0470544139 _qelectronic |
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024 | 7 |
_a10.1109/9780470544136 _2doi |
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035 | _a(CaBNVSL)mat05265562 | ||
035 | _a(IDAMS)0b000064810c5655 | ||
040 |
_aCaBNVSL _beng _erda _cCaBNVSL _dCaBNVSL |
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050 | 4 |
_aTK7895.M4 _b.S4897 2003eb |
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082 | 0 | 4 |
_a621.39/732 _222 |
100 | 1 |
_aSharma, Ashok K., _eauthor. |
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245 | 1 | 0 |
_aAdvanced semiconductor memories : _barchitectures, designs, and applications / _cAshok K. Sharma. |
264 | 1 |
_aPiscataway, New Jersey : _bIEEE Press, _cc2003. |
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264 | 2 |
_a[Piscataqay, New Jersey] : _bIEEE Xplore, _c[2002] |
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300 |
_a1 PDF (xvii, 652 pages) : _billustrations. |
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336 |
_atext _2rdacontent |
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337 |
_aelectronic _2isbdmedia |
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338 |
_aonline resource _2rdacarrier |
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504 | _aIncludes bibliographical references and index. | ||
505 | 0 | _aPreface. Introduction to Advanced Semiconductor Memories. Static Random Access Memory Technologies. High-Performance Dynamic random Access Memories. Application-Specific Dram Architectures and Designs. Advanced Nonvolatile Memory Designs and Technologies. Embedded Memories Designs and Applications. Future Memory Directions: Megabytes to Terabytes. Index. | |
506 | 1 | _aRestricted to subscribers or individual electronic text purchasers. | |
520 | _aA valuable reference for the most vital microelectronic components in the marketplace DRAMs are the technology drivers of high volume semiconductor fabrication processes for new generation products that, in addition to computer markets, are finding increased usage in automotive, aviation, military and space, telecommunications, and wireless industries. A new generation of high-density and high-performance memory architectures evolving for mass storage devices, including embedded memories and nonvolatile flash memories, are serving a diverse range of applications. Comprehensive and up to date, Advanced Semiconductor Memories: Architectures, Designs, and Applications offers professionals in the semiconductor and related industries an in-depth review of advanced semiconductor memories technology developments. It provides details on: . Static Random Access Memory technologies including advanced architectures, low voltage SRAMs, fast SRAMs, SOI SRAMs, and specialty SRAMs (multiport, FIFOs, CAMs). High Performance Dynamic Random Access Memory-DDRs, synchronous DRAM/SGRAM features and architectures, EDRAM, CDRAM, Gigabit DRAM scaling issues and architectures, multilevel storage DRAMs, and SOI DRAMs. Applications-specific DRAM architectures and designs - VRAMs, DDR SGRAMs, RDRAMs, SLDRAMs, 3-D RAM. Advanced Nonvolatile Memory designs and technologies, including floating gate cell theory, EEPROM/flash memory cell design, and multilevel flash. FRAMs and reliability issues. Embedded memory designs and applications, including cache, merged processor, DRAM architectures, memory cards, and multimedia applications. Future memory directions with megabytes to terabytes storage capacities using RTDs, single electron memories, etc. A continuation of the topics introduced in Semiconductor Memories: Technology, Testing, and Reliability, the author's earlier work, Advanced Semiconductor Memories: Architectures, Designs, and Applications offers a much-needed reference to the major developments and future directions of advanced semiconductor memory technology. | ||
530 | _aAlso available in print. | ||
538 | _aMode of access: World Wide Web | ||
588 | _aDescription based on PDF viewed 12/21/2015. | ||
650 | 0 | _aSemiconductor storage devices. | |
655 | 0 | _aElectronic books. | |
695 | _aArrays | ||
695 | _aBuilt-in self-test | ||
695 | _aCapacitance | ||
695 | _aCapacitors | ||
695 | _aCircuit faults | ||
695 | _aClocks | ||
695 | _aComputer architecture | ||
695 | _aEPROM | ||
695 | _aFerroelectric films | ||
695 | _aFlash memory | ||
695 | _aGraphics | ||
695 | _aIndexes | ||
695 | _aLogic gates | ||
695 | _aMOS devices | ||
695 | _aMagnetization | ||
695 | _aMemory management | ||
695 | _aMicroprocessors | ||
695 | _aNoise | ||
695 | _aNonvolatile memory | ||
695 | _aPerformance evaluation | ||
695 | _aPins | ||
695 | _aRNA | ||
695 | _aRandom access memory | ||
695 | _aRead only memory | ||
695 | _aResistance | ||
695 | _aSDRAM | ||
695 | _aSemiconductor memory | ||
695 | _aSynchronization | ||
695 | _aSystem-on-a-chip | ||
710 | 2 |
_aJohn Wiley & Sons, _epublisher. |
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710 | 2 |
_aIEEE Xplore (Online service), _edistributor. |
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776 | 0 | 8 |
_iPrint version: _z9780471208136 |
856 | 4 | 2 |
_3Abstract with links to resource _uhttps://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265562 |
999 |
_c42099 _d42099 |