| 000 | 03294nam a2200877 i 4500 | ||
|---|---|---|---|
| 001 | 5361029 | ||
| 003 | IEEE | ||
| 005 | 20191218152119.0 | ||
| 006 | m o d | ||
| 007 | cr |n||||||||| | ||
| 008 | 110519t20152009njua ob 001 0 eng d | ||
| 010 | _z 2011377262 (print) | ||
| 015 | _zGBA944641 (print) | ||
| 015 | _z015-17502 (print) | ||
| 016 | _z015175021 (print) | ||
| 020 |
_a9780470455265 _qelectronic |
||
| 020 |
_z9780471731726 _qpaper |
||
| 020 |
_z0471731722 _qpaper |
||
| 020 |
_z0470455268 _qelectronic |
||
| 024 | 7 |
_a10.1002/9780470455265 _2doi |
|
| 035 | _a(CaBNVSL)mat05361029 | ||
| 035 | _a(IDAMS)0b00006481178849 | ||
| 040 |
_aCaBNVSL _beng _erda _cCaBNVSL _dCaBNVSL |
||
| 050 | 4 |
_aTK7871.99.M44 _bR455 2009eb |
|
| 084 |
_aELT 358f _2stub |
||
| 084 |
_aZN 4960 _2rvk |
||
| 245 | 0 | 0 |
_aReliability wearout mechanisms in advanced CMOS technologies / _cAlvin W. Strong ... [et al.]. |
| 264 | 1 |
_aPiscataway, New Jersey : _bIEEE Press, _cc2009. |
|
| 300 |
_a1 PDF (xv, 624 pages) : _billustrations. |
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| 336 |
_atext _2rdacontent |
||
| 337 |
_aelectronic _2isbdmedia |
||
| 338 |
_aonline resource _2rdacarrier |
||
| 490 | 1 |
_aIEEE Press series on microelectronic systems ; _v12 |
|
| 504 | _aIncludes bibliographical references and index. | ||
| 505 | 0 | _aIntroduction / Alvin W. Strong -- Dielectric characterization and reliability methodology / Ernest Y. Wu, Rolf-Peter Vollertsen, and Jordi Su�n�e -- Dielectric breakdown of gate oxides: physics and experiments / Ernest Y. Wu, Rolf-Peter Vollertsen, and Jordi Su�n�e -- Negative bias temperature instabilities in pMOSFET devices / Giuseppe LaRosa -- Hot carriers / Stewart E. Rauch, III -- Stress-induced voiding / Timothy D. Sullivan -- Electromigration / Timothy D. Sullivan. | |
| 506 | 1 | _aRestricted to subscribers or individual electronic text purchasers. | |
| 538 | _aMode of access: World Wide Web. | ||
| 588 | _aDescription based on PDF viewed 12/18/2015. | ||
| 650 | 0 |
_aMetal oxide semiconductors, Complementary _xReliability. |
|
| 655 | 0 | _aElectronic books. | |
| 695 | _aAcceleration | ||
| 695 | _aAtomic measurements | ||
| 695 | _aBooks | ||
| 695 | _aCMOS integrated circuits | ||
| 695 | _aCMOS technology | ||
| 695 | _aCharge carrier processes | ||
| 695 | _aDegradation | ||
| 695 | _aDielectrics | ||
| 695 | _aElectric breakdown | ||
| 695 | _aElectromigration | ||
| 695 | _aElectron traps | ||
| 695 | _aForce | ||
| 695 | _aHot carriers | ||
| 695 | _aIndexes | ||
| 695 | _aInterface states | ||
| 695 | _aJunctions | ||
| 695 | _aLogic gates | ||
| 695 | _aMOSFET circuits | ||
| 695 | _aMaterials | ||
| 695 | _aMetallization | ||
| 695 | _aNitrogen | ||
| 695 | _aReliability | ||
| 695 | _aReliability engineering | ||
| 695 | _aSilicon | ||
| 695 | _aStrain | ||
| 695 | _aStress | ||
| 695 | _aSubstrates | ||
| 695 | _aTransistors | ||
| 695 | _aWires | ||
| 700 | 1 |
_aStrong, Alvin Wayne, _d1946- |
|
| 710 | 2 |
_aIEEE Xplore (Online Service), _edistributor. |
|
| 710 | 2 |
_aWiley, _epublisher. |
|
| 776 | 0 | 8 |
_iPrint version: _w 2011377262 _z9780471731726 |
| 830 | 0 |
_aIEEE Press Series on Microelectronic Systems ; _v12 |
|
| 856 | 4 | 2 |
_3Abstract with links to resource _uhttps://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029 |
| 999 |
_c42200 _d42200 |
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