000 | 04398nam a2200877 i 4500 | ||
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001 | 5713286 | ||
003 | IEEE | ||
005 | 20191218152120.0 | ||
006 | m o d | ||
007 | cr |n||||||||| | ||
008 | 151221s2011 njua ob 001 eng d | ||
020 |
_a9780470634417 _qebook |
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020 |
_z0470634413 _qelectronic |
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020 |
_z9780470484173 _qhardback : print |
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020 |
_z0470484179 _qhardback : alk. paper |
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024 | 7 |
_a10.1002/9780470634417 _2doi |
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035 | _a(CaBNVSL)mat05713286 | ||
035 | _a(IDAMS)0b000064814b54a0 | ||
040 |
_aCaBNVSL _beng _erda _cCaBNVSL _dCaBNVSL |
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050 | 4 |
_aTJ211 _b.R63 2010eb |
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245 | 0 | 0 |
_aRobotic microassembly / _cedited by Micha�el Gauthier, St�ephane R�egnier. |
264 | 1 |
_aPiscataway, New Jersey : _bIEEE Press, _cc2010. |
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264 | 2 |
_a[Piscataqay, New Jersey] : _bIEEE Xplore, _c[2011] |
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300 |
_a1 PDF (xvii, 306 pages) : _billustrations |
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336 |
_atext _2rdacontent |
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337 |
_aelectronic _2isbdmedia |
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338 |
_aonline resource _2rdacarrier |
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504 | _aIncludes bibliographical references and index. | ||
505 | 0 | _aFrontmatter -- Modeling of the Microworld. Microworld Modeling in Vacuum and Gaseous Environments / Pierre Lambert, S�aetphane �aeRgnier -- Microworld Modeling: Impact of Liquid and Roughness / Pierre Lambert, S�aetphane �aeRgnier -- Handling Strategies. Unified View of Robotic Microhandling and Self-Assembly / Quan Zhou, Veikko Sariola -- Toward a Precise Micromanipulation / M�aelanie Dafflon, Reymond Clavel -- Microhandling Strategies and Microassembly in Submerged Medium / Micha�el Gauthier -- Robotic and Microassembly. Robotic Microassembly of 3D MEMS Structures / Nikolai Dechev -- High-Yield Automated MEMS Assembly / Dan O Popa, Harry E Stephanou -- Design of a Desktop Microassembly Machine and its Industrial Application to Microsolder Ball Manipulation / Akihiro Matsumoto, Kunio Yoshida, Yusuke Maeda -- Index. | |
505 | 0 | _aMicroworld modeling in vacuum and gaseous environments / Pierre Lambert and St�ephane R�egnier -- Microworld modeling : impact of liquid and roughness / Pierre Lambert and St�ephane R�egnier -- Unified view of robotic microhandling and self-assembly / Quan Zhou and Veikko Sariola -- Toward a precise micromanipulation / M�elanie Dafflon and Reymond Clavel -- Microhandling strategies and microassembly in submerged medium / Micha�el Gauthier -- Robotic microassembly of 3D MEMS structures / Nikolai Dechev -- High-yield automated MEMS assembly / Dan O. Popa and Harry E. Stephanou -- Design of a desktop microassembly machine and its industrial application to microsolder ball manipulation / Akihiro Matsumoto, Kunio Yoshida, and Yusuke Maeda. | |
506 | 1 | _aRestricted to subscribers or individual electronic text purchasers. | |
530 | _aAlso available in print. | ||
538 | _aMode of access: World Wide Web | ||
588 | _aTitle from PDF t.p. (IEEE Xplore, viewed Feb. 9, 2011) | ||
588 | _aDescription based on PDF viewed 12/21/2015. | ||
650 | 0 | _aRobotics. | |
650 | 0 | _aRobots, Industrial. | |
650 | 0 | _aMicrofabrication. | |
655 | 0 | _aElectronic books. | |
695 | _aAccuracy | ||
695 | _aAdhesives | ||
695 | _aConnectors | ||
695 | _aCurrent measurement | ||
695 | _aDielectrophoresis | ||
695 | _aElectric potential | ||
695 | _aElectrodes | ||
695 | _aElectrostatics | ||
695 | _aForce | ||
695 | _aGrippers | ||
695 | _aGuidelines | ||
695 | _aIndexes | ||
695 | _aIons | ||
695 | _aMathematical model | ||
695 | _aMicroassembly | ||
695 | _aMicromanipulators | ||
695 | _aMicromechanical devices | ||
695 | _aMicroscopy | ||
695 | _aMicrostructure | ||
695 | _aPosition measurement | ||
695 | _aRobots | ||
695 | _aRough surfaces | ||
695 | _aSections | ||
695 | _aSelf-assembly | ||
695 | _aService robots | ||
695 | _aSubstrates | ||
695 | _aSurface roughness | ||
695 | _aSurface topography | ||
695 | _aThree dimensional displays | ||
695 | _aTorque | ||
700 | 1 | _aR�egnier, St�ephane. | |
700 | 1 |
_aGauthier, Mich�ael, _d1975- |
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710 | 2 |
_aIEEE Xplore (Online Service), _edistributor. |
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710 | 2 |
_aWiley Interscience (online service), _epublisher. |
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776 | 0 | 8 |
_iPrint version: _z9780470484173 |
856 | 4 | 2 |
_3Abstract with links to resource _uhttps://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5713286 |
999 |
_c42276 _d42276 |