VLSI testing: Digital and mixed analogue/digital techniques
By: Hurst, S. L.
Material type: BookSeries: IEE circuits, devices and systems series; no. 9.Publisher: London IEE 1998Description: xx, 532p.ISBN: 0-85296-901-5.Item type | Current location | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|
621.3950287 HUR (Browse shelf) | Available | 503134 |
Browsing International Institute of Information Technology Bangalore Shelves Close shelf browser
621.395 YEA Practical low power digital VLSI design | 621.3950285 DEM Synthesis and optimization of digital circuits | 621.3950285 KUR Its methodology, stupid! | 621.3950287 HUR VLSI testing: Digital and mixed analogue/digital techniques | 621.397 GOR Algebraic shift register sequences | 621.397 JIN High performance mass storage and parallel I/O: Technologies and applications | 621.3972 LEE The design of CMOS radio-frequency integrated circuits |
There are no comments for this item.