Journey to data quality
By: Lee, Y. W. et.al.
Material type: BookPublisher: Cambridge; Massachusetts MIT Press 2006Description: xii, 226p.ISBN: 978-0-262-12287-0.Item type | Current location | Call number | Status | Date due | Barcode |
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658.4038 LEE (Browse shelf) | Available | 506207 |
Browsing International Institute of Information Technology Bangalore Shelves Close shelf browser
658.4038 KAL Big data applications in industry 4.0 | 658.4038 KRI Enterprise IT: Emerging landscape | 658.4038 KRI New age enterprise IT | 658.4038 LEE Journey to data quality | 658.4038 MAL Principles of enterprise IT architecture | 658.4038 MAL Organizing business knowledge: The MIT process handbook | 658.4038 MCK Waves of change: Business evolution through information technology |
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