Photoinduced Defects in Semiconductors
By: Redfield, D.
Material type: BookSeries: Cambridge Studies in Semiconductor Phusics and Microelectron.Publisher: Cambridge Cambridge University Press 1996Description: x, 217p.ISBN: 0-521-46196-0.Item type | Current location | Call number | Status | Date due | Barcode |
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621.38152 RED (Browse shelf) | Available | 508306 |
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621.38152 NIK Microelectronic devices and fundamentals of their design | 621.38152 OZO Magnetic convection | 621.38152 PIE Semiconductor device fundamentals: With computer-based execr | 621.38152 RED Photoinduced Defects in Semiconductors | 621.38152 SCH Doping in III-V Semiconductors | 621.38152 STR Solid state electronic devices. 5th. Edition. | 621.38152 STR Solid state electronic devices. 6ed. |
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