VLSI testing: Digital and mixed analogue/digital techniques
By: Hurst, S. L.
Material type: BookSeries: IEE circuits, devices and systems series; no. 9.Publisher: London IEE 1998Description: xx, 532p.ISBN: 0-85296-901-5.Item type | Current location | Call number | Status | Date due | Barcode |
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621.3950287 HUR (Browse shelf) | Available | 503134 |
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